AFM

Atomic Force Microscopy Lab

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The group owns a Asylum Research MFP-3D Atomic Force Microscope. It operates with most common imaging modes for topography characterization in ambient, N2 atmosphere and liquid. Besides it supports advanced techniques such as Conductive-AFM (C-AFM), Kelvin Probe Force Microscopy (KPFM), Electrical Force Microscopy (EFM), Magnetic Force Microscopy (MFM) and Piezoresponse Force Microscopy (PFM) for electrical and magnetic characterization at the nanometric scale.

Additional modules:

ORCA module: for current map imaging and I-V characteristics measurement capabilities. It can measure in a range from 1pA to 100 mA.

Variable Field Module : enables to apply static magnetic fields up to ±0.8 Tesla parallel to the sample plane.

CoolerHeater holder: Peltier system that enables to heat and cool samples from -30°C to +120°C.

External Current Amplifier DLPCA-200: Low noise variable gain transimpedance amplifier that allows current measurement over a wide range of gains (from 10³ to 10¹¹ V/A).